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Reference materials:ECE4121/ECE4141,VLSI Design,Design Metrics by AHM Zahirul Alam.
Cost of IC Chip=Non-recurring expenditure(NRE)+Recurring Expenditure(RE)
NRE is the fixed cost of mask generation. It is one-time cost factor.
RE is the expenditure incurred in Silicon procesing, packaging, volume of production and the die area.
70nm ASIC incurs $4M NRE on account of masks.
"The club of people who can offer an extreme sub-micron ASIC or COD design is getting pretty exclusive."Ron Wilson,EE Times (May,2000)
The Cost Metrics of the IC Chip.
Chip | M.L | L.W(μm) | W.C($) | W.D(mm) | D/cm 2 | D.S.(mm) | D(mm 2 ) | D/W | Y(%) | D.C.($) |
386DX | 2 | 0.9 | 900 | 150 | 1 | 10 | 43 | 360 | 71 | 4 |
486DX2 | 3 | 0.8 | 1200 | 150 | 1 | 12 | 81 | 181 | 54 | 12 |
P.PC601 | 4 | 0.8 | 1700 | 150 | 1.3 | 121 | 115 | 28 | 53 | |
_7100 | 3 | 0.8 | 1300 | 150 | 1 | 196 | 66 | 27 | 73 | |
DECα | 3 | 0.7 | 1500 | 150 | 1.2 | 234 | 53 | 19 | 149 | |
S.SPARC | 3 | 0.7 | 1700 | 150 | 1.6 | 256 | 48 | 13 | 272 | |
Pent. | 3 | 0.8 | 1500 | 150 | 1.5 | 18 | 296 | 40 | 9 | 417 |
M.L.-metal layers, L.W.-line width,W.C.-Wafer Cost,W.D.-Wafer Diameter(mm),D./cm^2-defects per cm square,D.S.-die size(mm),D(mm^2)-Die Area(mm square),D/W-Dies/Wafer, Y-Yield,D.C.-Die Cost($)
Algorithm for calculating the die cost:
Recurring costs:
Variable Cost =
Where : Cost of Die =
die yield= [1+((defect/area)*(die area))/alpha]^(-alpha)
One example:
Wafer size = 12’’ = 30.48 cm;
Die size = 2.5 cm 2 ;
1 defect/cm 2 ;
alpha=α= 3( complexity);
Number of dies per wafer = 252 dies /wafer;
Die yield = 16 %;
252×0.16 = 40 die/wafer;
40 die per wafer can actually be marketed.
Hence die cost = wafer cost/40 ;
Die cost is a strong function of die area.
Die cost is proportional to the Nth power of die area where n=3 to 4.
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